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Metrology & Inspection


AIT

The CMT-SR5000 is a high precision Four Point Prone system equipped to measure the Sheet Resistance and Resistivity of Silicon Wafer. This system is designed for easy operation by a
personal computer with exclusive software, and this software has functions for various data analyses mapping and so on.

 

For more information, please visit : www.fpp.co.kr

 

 

 


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