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Single Wafer Process Etching, PR Striping, Cleaning, Thin Film Deposition, Bonder, Debonder, Wafer Transfer Taping-Detaping & CMP
GPTC
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Metrology & Inspection
Carl Zeiss
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Sentronics Metrology
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FA & QRA Lab Solutions
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Specialty Materials Chemicals
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Metrology & Inspection


Sentronics
Metrology

SemDex 301 is a semi-automatic wafer inspection system: up to 300-mm wafers (also with frames)   for manual and fully automated measurement. Measured parameters are layer thickness, TTV, bow/warp, and flatness; TSV depths and roughness.

 

For more information, please visit: www.sentronics-metrology.de

 

 

 


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