Semiconductor Equipment & Materials
Metrology & Inspection
CMT-SR5000
The CMT-SR5000 is a high precision Four Point Prone system equipped to measure the Sheet Resistance and Resistivity of Silicon Wafer. This system is designed for easy operation by a personal computer with exclusive software, and this software has functions for various data analyses mapping and so on.
For more information, please visit www.fpp.co.kr.