Regional
BusinessNetwork
Serving the Leading Industry

01

Providing
Quality Products

RBN distributes and supplies quality products manufactured in Japan, Taiwan, Korea, USA and Europe. We specialise in Metrology & Inspection Equipment, Process Etch & Thin Film Deposition Equipment, Specialty Materials & Chemicals, FA & QRA Lab Solutions as well as Parts and Repair Services.

What We Offer

Reliable Technology Solutions

Quality products manufactured in Japan, Taiwan, Korea, USA and Europe.

Specialty Materials & Chemicals

Materials in metal etch and photoresist strip, Silicon Wafers, Targets/Crucibles.

Direct & Efficient Technical Support

We stand behind the products we distribute.

Wide Industry & Market Coverage

We support many customers in Semiconductor, Electronics, Renewable Energy and Biotechnology industries.

Why Choose Us

Incorporated in Singapore in year 2000, RBN has since grown its network in Southeast Asia. We work with established partners in distribution of equipment and materials of the highest quality to our customers in the region.

What We Offer

Our mission is to maximize customer satisfaction and achieve sustainable business growth by providing quality products and efficient technical support.

News / Events

13

Aug

SEMICON EUROPA


We will be meeting suppliers in Europe during SEMICON EUROPA.

13

Aug

SEMICON Taiwan 2020


We will be meeting suppliers in the premier event in Taiwan for microelectronics manufacturing.

02

Critical Support
In Many Industries

Many different industries leverage on our expertise in products and materials used in Wafer Fabrication & Packaging, Metrology & Inspection, and QRA & Materialographic Preparation.

Cello
Nasca-20 Plus, ICP-RIE

APPLICATIONS • Anisotropic etching of silicon films for ULSI devices. • Etching of metal films. • Etching of GaAs, GaN, InP and other Compound semiconductor films. • Silicon Deep etching (MEMS). • Production of waveguide devices.

Sentronics Metrology
SemDex

The SemDex series comprises semi-automatic & fully automated wafer metrology & inspection systems for: • Silicon substrate • Thick film PR • Thin Film oxide/ nitride. Containing multiple optical measuring instruments, they are capable of measuring multi-layer thickness, TTV, bow/warp, stress and flatness; TSV depths, roughness, 3D-CD, micro-bump & Laser...

03

We Are Always Open
For Discussion & Support

We welcome discussion with new industries requiring our technical expertise, as well as offering continued technical support to all our customers.